Electrodeposition and characterization of transparent ZnO thin films

被引:71
作者
Mahalingam, T [1 ]
John, VS
Raja, M
Su, YK
Sebastian, PJ
机构
[1] Alagappa Univ, Dept Phys, Karaikkudi 630003, Tamil Nadu, India
[2] Natl Cheng Kung Univ, Dept Elect Engn, Inst Microelect, Tainan 70101, Taiwan
[3] Univ Nacl Autonoma Mexico, CIE, Solar Hydrogen Fuel Cell Grp, Temixco 62580, Morelos, Mexico
关键词
zinc oxide; wurtzite structure; X-ray diffraction; optical properties; surface morphology;
D O I
10.1016/j.solmat.2004.06.021
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Thin films of zinc oxide (ZnO) have been grown by potentiostatic cathodic deposition onto tin oxide-coated glass from a simple aqueous zinc nitrate electrolyte. Cyclic voltammetry (CV) experiments were performed to determine the reaction kinetics of the species. The various optimum deposition parameters like potential, pH and bath temperature are found to be -1.1 V (SCE), 5 +/- 0.1 and 80 degrees C, respectively. Structural characterization by X-ray diffraction indicates the formation of ZnO film with a preferred c-axis orientation and exhibits the wurtzite structure. Optical studies revealed a band gap energy 3.32 eV which is characteristic of ZnO films. SEM micrographs show a compact structure with nodular appearance, which is in agreement with the reported value of ZnO and the results are discussed. (c) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:227 / 235
页数:9
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