Antireflection coatings designed for two different infrared substrates

被引：9

作者：

Dobrowolski, JA ^{[1
]}

Panchhi, P ^{[1
]}

High, M ^{[1
]}

机构：

[1] APPL PHYS SPECIALTIES LTD,DON MILLS,ON M3C 2H2,CANADA

来源：

APPLIED OPTICS | 1996年 / 35卷 / 01期

关键词：

Film packing density; Fluorides; Infrared transmission spectroscopy; Molecular beam deposition;

D O I：

10.1364/AO.35.000102

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

It is shown that it is possible to design normal-incidence antireflection coatings that simultaneously reduce the reflectance of two different substrates. Although this is at the expense of some deterioration in performance when compared with that of conventional coatings, it can lead to significant time and cost savings in small thin-film production facilities. Numerical examples are presented for ZnS/ZnSe, Si/Ge, and ZnS/Ge substrate pairs. The experimental measurements on one such coating are in good agreement with the calculated performance.

引用

页码：102 / 105

页数：4