Efficiency of quasiparticle evacuation in superconducting devices

被引：33

作者：

Rajauria, Sukumar ^{[1
]}

Pascal, L. M. A. ^{[1
]}

Gandit, Ph ^{[1
]}

Hekking, F. W. J. ^{[2
]}

Pannetier, B. ^{[1
]}

Courtois, H. ^{[1
]}

机构：

[1] CNRS, Inst Neel, F-38042 Grenoble, France

[2] Univ Grenoble 1, LPMMC, F-38042 Grenoble, France

来源：

PHYSICAL REVIEW B | 2012年 / 85卷 / 02期

关键词：

JUNCTIONS; REFRIGERATION; LIFETIMES;

D O I：

10.1103/PhysRevB.85.020505

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The diffusion of excess quasiparticles in a current-biased superconductor strip in proximity to a metallic trap junction is studied. In particular, we have measured accurately the superconductor temperature at a near-gap injection voltage. By analyzing our data quantitatively, we provide a full description of the spatial distribution of excess quasiparticles in the superconductor. We show that a metallic trap junction contributes significantly to the evacuation of excess quasiparticles.

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页数：4

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