Scanning infrared deflectometry for the inspection of diffusely reflecting surfaces

被引：3

作者：

Hoefer, Sebastian ^{[1
]}

Beyerer, Juergen ^{[1
,2
]}

机构：

[1] KIT, Lehrstuhl Interakt Echtzeitsyst IES, Adenauerring 4, D-76131 Karlsruhe, Germany

[2] Fraunhofer Inst Optron Syst Tech & Bildauswertung, Fraunhoferstr 1, D-76131 Karlsruhe, Germany

来源：

TM-TECHNISCHES MESSEN | 2016年 / 83卷 / 06期

关键词：

Deflectometry; infrared; diffusely reflective surfaces; thermal patterns;

D O I：

10.1515/teme-2016-0004

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Infrared deflectometry stands for the application of the deflectometric measurement principle in the thermal infrared spectrum. This enables in particular the deflectometric inspection of rough metal surfaces, as such surfaces exhibit a specular reflection in this spectrum. This article covers the creation and evaluation of the necessary thermal code patterns. We introduce several methods which either utilize an industrial robot or allow for an inline inspection of linear moving objects. Furthermore, we present a new method for the evaluation of the code patterns to create a deflectometric registration. We present the application of these methods on practical examples.

引用

页码：374 / 385

页数：12

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