Quantification of gluten in wheat flour by FT-Raman spectroscopy

被引：30

作者：

Czaja, Tomasz ^{[1
]}

Mazurek, Sylwester ^{[1
]}

Szostak, Roman ^{[1
]}

机构：

[1] Univ Wroclaw, Dept Chem, 14 F Joliot Curie, PL-50383 Wroclaw, Poland

来源：

FOOD CHEMISTRY | 2016年 / 211卷

关键词：

Gluten; Flour; Raman spectroscopy; Quantitative analysis; Multivariate calibration; PREDICTION; PARAMETERS; QUALITY;

D O I：

10.1016/j.foodchem.2016.05.108

中图分类号：

O69 [应用化学];

学科分类号：

081704 ;

摘要：

A procedure for the quantitative determination of gluten in wheat flour based on partial least squares (PLS) treatment of FT-Raman data is described. Results of similar quality were found using a PLS model derived from NIR (near infrared) spectra obtained in DRIFTS (diffuse reflectance infrared Fourier transform spectroscopy) mode and of slightly worse quality from the model constructed based on IR (infrared) spectra registered using a single reflection ATR (attenuated total reflection) diamond accessory. The relative standard errors of prediction (RSEP) were calculated for the calibration, validation and analysed data sets. These errors amounted to 3.2-3.6%, 3.5-3.8% and 4.8-5.7% for the three techniques applied, respectively. The proposed procedures can be used as simple, fast and accurate methods for the quantitative analysis of gluten in flour. (C) 2016 Elsevier Ltd. All rights reserved.

引用

页码：560 / 563

页数：4

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