A degradation mechanism of organic light-emitting devices

被引：60

作者：

Aziz, H

Xu, G

机构：

[1] Dept. of Mat. Sci. and Engineering, McMaster University, Hamilton

来源：

SYNTHETIC METALS | 1996年 / 80卷 / 01期

关键词：

degradation; devices; light emission;

D O I：

10.1016/0379-6779(96)03660-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A novel mechanism is revealed for the degradation and failure of the recently developed organic light-emitting device (OLED) made of indium-tin oxide (ITO)/poly(p-phenylenevinylene)/aluminum (or magnesium). A main obstacle to obtaining a long lifetime for these devices is found to be the electrochemical reaction on interfaces of both electron and hole injecting electrodes. As a result, the electrode materials are not only degraded, but they also form a complex with the bulk polymer which serves as a 'weak electrolyte'.

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页码：7 / 10

页数：4

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