Transition Metal Dichalcogenide Growth via Close Proximity Precursor Supply

被引:71
作者
O'Brien, Maria [1 ,2 ,3 ]
McEvoy, Niall [2 ,3 ]
Hallam, Toby [2 ,3 ]
Kim, Hye-Young [2 ,3 ]
Berner, Nina C. [2 ,3 ]
Hanlon, Damien [2 ,3 ,4 ]
Lee, Kangho [2 ,3 ]
Coleman, Jonathan N. [2 ,3 ,4 ]
Duesberg, Georg S. [1 ,2 ,3 ]
机构
[1] Trinity Coll Dublin, Sch Chem, Dublin 2, Ireland
[2] Trinity Coll Dublin, CRANN, Dublin 2, Ireland
[3] Trinity Coll Dublin, AMBER Ctr, Dublin 2, Ireland
[4] Trinity Coll Dublin, Sch Phys, Dublin 2, Ireland
关键词
MOS2 ATOMIC LAYERS; VAPOR-PHASE GROWTH; MONOLAYER MOS2; SINGLE-LAYER; TRANSPORT-PROPERTIES; LIQUID EXFOLIATION; GRAIN-BOUNDARIES; NANOSHEETS; GRAPHENE; WS2;
D O I
10.1038/srep07374
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Reliable chemical vapour deposition (CVD) of transition metal dichalcogenides (TMDs) is currently a highly pressing research field, as numerous potential applications rely on the production of high quality films on a macroscopic scale. Here, we show the use of liquid phase exfoliated nanosheets and patterned sputter deposited layers as solid precursors for chemical vapour deposition. TMD monolayers were realized using a close proximity precursor supply in a CVD microreactor setup. A model describing the growth mechanism, which is capable of producing TMD monolayers on arbitrary substrates, is presented. Raman spectroscopy, photoluminescence, X-ray photoelectron spectroscopy, atomic force microscopy, transmission electron microscopy, scanning electron microscopy and electrical transport measurements reveal the high quality of the TMD samples produced. Furthermore, through patterning of the precursor supply, we achieve patterned growth of monolayer TMDs in defined locations, which could be adapted for the facile production of electronic device components.
引用
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页数:7
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