Imaging of Located Buried Defects in Metal Samples by an Scanning Microwave Microscopy

被引：0

作者：

Rossignol, J. ^{[1
]}

Plassard, C. ^{[1
]}

Bourillot, E. ^{[1
]}

Calonne, O. ^{[1
]}

Foucault, M. ^{[2
]}

Lesniewska, E. ^{[1
]}

机构：

[1] Univ Bourgogne, Lab Inst Carnot Bourgogne, CNRS, UMR 5209, 9 Ave A Savary, F-21078 Dijon, France

[2] AREVA NP, F-71205 Paris, France

来源：

EUROSENSORS XXV | 2011年 / 25卷

关键词：

Scanning microwave microscopy; Non-destructive method;

D O I：

10.1016/j.proeng.2011.12.405

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A non-destructive method is proposed to detect the located buried defects using scanning microwave microscopy. Based on the "skin effect", our recent developments authorize 3D tomography with nanometric resolution. This technique associates the electromagnetic microwave measurement using a Vector Network Analyzer (VNA) with the nanometer-resolution positioning capabilities of an Atomic Force Microscope. At each used frequency, an incident electromagnetic wave is send to the sample and the reflected wave gives information on a specific depth layer in the material. With a large bandwidth of frequencies, a 3D tomography is allowed inside the material. With characteristic tools of nanotechnology, different samples are developed with local buried defects. The result of the tomography applied on these samples and stainless steel samples (from Areva NP) are in accordance with the skin effect equation. (C) 2011 Published by Elsevier Ltd.

引用

页数：4

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