Short-interval test-retest interrater reliability of the Dutch version of the structured clinical interview for DSM-IV personality disorders (SCID-II)

被引:104
作者
Weertman, A
ArntZ, A
Dreessen, L
van Velzen, C
Vertommen, S
机构
[1] Univ Limburg, Dept Med Clin & Expt Psychol, NL-6200 MD Maastricht, Netherlands
[2] Univ Groningen Hosp, Dept Psychiat, Groningen, Netherlands
[3] Univ Ctr St Jozef, Clin Psychol Unit, Kortenberg, Belgium
关键词
D O I
10.1521/pedi.17.6.562.25359
中图分类号
R749 [精神病学];
学科分类号
100205 ;
摘要
This study examined the short-interval test-retest reliability of the Structured Clinical Interview (SCID-II: First, Spitzer, Gibbon, & Williams, 1995) for DSM-IV personality disorders (PDs). The SCID-II was administered to 69 in- and outpatients on two occasions separated by 1 to 6 weeks. The interviews were conducted at three sites by ten raters. Each rater acted as first and as second rater and equal number of times. The test-retest interrater reliability for the presence or absence of any PD was fair to good (kappa = .63) and was higher than values found in previous short-interval test-retest studies with the SCID-II for DSM-III-R. Test-retest reliability coefficients for trait and sumscores were sufficient, except for dependent PD. Values for single criteria were variable, ranging from poor to good agreement. Further large-scale test-retest research is needed to test the interrater reliability of more categorical diagnoses and single traits.
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页码:562 / 567
页数:6
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