Shape-optimized electrooptic beam scanners: Analysis, design, and simulation

被引：37

作者：

Chiu, Y ^{[1
]}

Zou, J ^{[1
]}

Stancil, DD ^{[1
]}

Schlesinger, TE ^{[1
]}

机构：

[1] Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA

来源：

JOURNAL OF LIGHTWAVE TECHNOLOGY | 1999年 / 17卷 / 01期

基金：

美国国家科学基金会;

关键词：

BPM simulation; electrooptic (EO) scanner; ray equation; ray tracing; scanning sensitivity;

D O I：

10.1109/50.737429

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents the analysis of a general nonrectangular electrooptic (EO) scanner and compare its performance to a rectangular device. Since the scanning sensitivity of an EO scanner is inversely proportional to its width, high sensitivity requires the device contour to be close to the ray trajectory of a beam propagating through the device, Accordingly, a shaped-optimized scanner is designed so that the beam trajectory at maximum deflection is parallel to the device contour, A beam propagation method (BPM) simulation shows the performance agrees well with the analysis.

引用

页码：108 / 114

页数：7

共 9 条

[1]

BORN M, 1986, PRINCIPLES OPTICS, P121

[2] GUIDED-WAVE ELECTROOPTIC BEAM DEFLECTOR USING DOMAIN REVERSAL IN LITAO3 [J].

CHEN, QB ;

CHIU, Y ;

LAMBETH, DN ;

SCHLESINGER, TE ;

STANCIL, DD .

JOURNAL OF LIGHTWAVE TECHNOLOGY, 1994, 12 (08) :1401-1404

[3] DESIGN AND SIMULATION OF WAVE-GUIDE ELECTROOPTIC BEAM DEFLECTORS [J].

CHIU, Y ;

BURTON, RS ;

STANCIL, DD ;

SCHLESINGER, TE .

JOURNAL OF LIGHTWAVE TECHNOLOGY, 1995, 13 (10) :2049-2052

[4]

DITCHBURN RW, 1963, LIGHT, P699

[5] LIGHT-PROPAGATION IN GRADED-INDEX OPTICAL FIBERS [J].

FEIT, MD ;

FLECK, JA .

APPLIED OPTICS, 1978, 17 (24) :3990-3998

[6]

IRELAND CLM, 1980, P 4 NAT QUANT EL C E, P87

[7] LIGHT BEAM DEFLECTION WITH ELECTROOPTIC PRISMS [J].

LEE, TC ;

ZOOK, JD .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 1968, QE 4 (07) :442-&

[8]

LOTSPEICH JF, 1968, IEEE SPECTRUM FEB, P45

[9]

YARIV A, 1989, QUANTUM ELECTRON, P323

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