Vision system with high dynamic range for optical surface defect inspection

被引:11
作者
Cao, Zhaolou [1 ,2 ]
Cui, Fenping [1 ,2 ]
Zhai, Chunjie [3 ]
机构
[1] Nanjing Univ Informat Sci & Technol, Jiangsu Key Lab Optoelect Detect Atmosphere & Oce, Nanjing 210044, Jiangsu, Peoples R China
[2] Nanjing Univ Informat Sci & Technol, Sch Phys & Optoelect Engn, Nanjing 210044, Jiangsu, Peoples R China
[3] Nanjing Forest Police Coll, Dept Forest Fire Protect, Nanjing 210046, Jiangsu, Peoples R China
基金
中国国家自然科学基金;
关键词
Surface defects;
D O I
10.1364/AO.57.009981
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We report a machine vision system with high dynamic range designed for optical surface defect inspection. The system consists of two motorized linear stages and one motorized rotation stage for automatically scanning the surface. As the intensity of long scratches and digs differ a lot under dark-field illumination, gains of red, green, and blue channels are set to be different values to extend the dynamic range of an ordinary colored detector in a single snapshot, which greatly improves the efficiency compared with mukiexposure-based approaches. Image stitching is then employed to get a high-resolution image of the entire optical surface for further processing to quantitatively evaluate surface quality based on the standards of MIL-PRF-138308 and ISO 10110-7:2008. The system can be widely applied in the optical industry, as it provides a low-cost solution for optical surface quality checks. (C) 2018 Optical Society of America
引用
收藏
页码:9981 / 9987
页数:7
相关论文
共 19 条
[11]   Dark-field microscopic image stitching method for surface defects evaluation of large fine optics [J].
Liu, Dong ;
Wang, Shitong ;
Cao, Pin ;
Li, Lu ;
Cheng, Zhongtao ;
Gao, Xin ;
Yang, Yongying .
OPTICS EXPRESS, 2013, 21 (05) :5974-5987
[12]  
Ota H., 2006, Hitachi Review, V55, P78
[13]  
Robertson M. A., 1999, Proceedings 1999 International Conference on Image Processing (Cat. 99CH36348), P159, DOI 10.1109/ICIP.1999.817091
[14]   A system for measuring defect induced beam modulation on inertial confinement fusion-class laser optics - art. no. 59912H [J].
Runkel, M ;
Hawley-Fedder, R ;
Widmayer, C ;
Williams, W ;
Weinzapfel, C ;
Roberts, D .
Laser-Induced Damage in Optical Materials: 2005, 2005, 5991 :H9912-H9912
[15]  
Schoch A., 2018, P SOC PHOTO-OPT INS, V10679
[16]   Continuous Measurement of Particle Depth in a Microchannel Using Chromatic Aberration [J].
Su, Shin-Yu ;
Lin, Che-Hsin .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 2013, 31 (08) :1205-1210
[17]   Defect inspection of wafers by laser scattering [J].
Takami, K .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1997, 44 (1-3) :181-187
[18]   Spatially resolved surface topography retrieved from far-field intensity scattering measurements [J].
Zerrad, Myriam ;
Lequime, Michel ;
Amra, Claude .
APPLIED OPTICS, 2014, 53 (04) :A297-A304
[19]   Defects evaluation system for spherical optical surfaces based on microscopic scattering dark-field imaging method [J].
Zhang, Yihui ;
Yang, Yongying ;
Li, Chen ;
Wu, Fan ;
Chai, Huiting ;
Yan, Kai ;
Zhou, Lin ;
Li, Yang ;
Liu, Dong ;
Bai, Jian ;
Shen, Yibing .
APPLIED OPTICS, 2016, 55 (23) :6162-6171