Charge collection efficiency of an irradiated cryogenic double-p silicon detector

被引:9
作者
Borer, K
Janos, S
Li, Z
Dezillie, B
Da Viá, C
Granata, V
Casagrande, L [1 ]
de Boer, RWI
Lourenço, C
Niinikoski, TO
Palmieri, VG
Chapuy, S
Dimcovski, Z
Grigoriev, E
Bell, W
Devine, SRH
Ruggiero, G
O'Shea, V
Smith, K
Berglund, P
de Boer, W
Hauler, F
Heising, S
Jungermann, L
Abreu, M
Rato, P
Sousa, P
Cindro, V
Mikuz, M
Zavrtanik, M
Esposito, A
Paul, S
Buontempo, S
D'Ambrosio, N
Pagano, S
Eremin, V
Verbitskaya, E
机构
[1] CERN, Div EP, CH-1211 Geneva 23, Switzerland
[2] Univ Bern, Lab Hochenergiephys, CH-3012 Bern, Switzerland
[3] Brookhaven Natl Lab, Upton, NY 11973 USA
[4] Brunel Univ, Uxbridge UB8 3PH, Middx, England
[5] Univ Geneva, Dept Radiol, CH-1211 Geneva, Switzerland
[6] Univ Glasgow, Dept Phys & Astron, Glasgow G12 8QQ, Lanark, Scotland
[7] Helsinki Univ Technol, Low Temp Lab, FI-02150 Espoo, Finland
[8] Univ Karlsruhe, IEKP, D-76128 Karlsruhe, Germany
[9] LIP, P-1000 Lisbon, Portugal
[10] Jozef Stefan Inst, Exp Particle Phys Dept, Ljubljana 1001, Slovenia
[11] Tech Univ Munich, Dept Phys E18, D-85748 Garching, Germany
[12] Univ Frederico II Napoli, Dipartimento Fis, Naples, Italy
[13] Ist Nazl Fis Nucl, I-80125 Naples, Italy
[14] Russian Acad Sci, AF Ioffe Physicotech Inst, St Petersburg 194021, Russia
关键词
cryogenic silicon detectors; Lazarus effect;
D O I
10.1016/S0168-9002(01)00198-X
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We present results on the measurement of the charge collection efficiency of a p(+) /n/p(+) silicon detector irradiated to 1 x 10(15) n/cm(2), Operated in the temperature range between 80 and 200 K. For comparison, measurements obtained with a standard silicon diode (p(+) /n/n(+)), irradiated to the same fluence, are also presented. Both detectors show a dramatic increase of the CCE when operated at temperatures around 130 K. The double-p detector shows a higher CCE regardless of the applied bias and temperature, besides being symmetric with respect to the polarity of the bias voltage.
引用
收藏
页码:474 / 483
页数:10
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