REDUCTION AND ANALYSIS OF TWO-DIMENSIONAL DIFFRACTION DATA INCLUDING TEXTURE ANALYSIS

被引：2
|
作者：
Vogel, Sven C. [1 ]
机构：
[1] Los Alamos Natl Lab, LANSCE, Los Alamos, NM 87545 USA
来源：
HIGH-PRESSURE CRYSTALLOGRAPHY: FROM FUNDAMENTAL PHENOMENA TO TECHNOLOGICAL APPLICATIONS | 2010年
关键词：
Diffraction data analysis; Rietveld refinement; texture analysis; X-RAY-DIFFRACTION; QUANTITATIVE PHASE-ANALYSIS; HIGH-PRESSURE DEFORMATION; DIAMOND-ANVIL CELL; POWDER-DIFFRACTION; RIETVELD REFINEMENT; MAGNETIC-STRUCTURES; DETECTOR SYSTEMS; ROUND-ROBIN; R-FACTORS;
D O I：
10.1007/978-90-481-9258-8_11
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
This chapter provides a commented list of references which the author considers useful for diffraction data analysis such as references relating to Rietveld analysis. In particular, references relating to the analysis of two-dimensional detector data such as image plates or CCDs are given. Literature dealing with texture analysis and interpretation as well as web links for software and online tutorials are also provided.
引用
收藏
页码：123 / 133
页数：11
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