Benchmarking the compton coincidence technique for measuring electron response non-proportionality in inorganic scintillators

被引:96
作者
Rooney, BD
Valentine, JD
机构
[1] Department of Mechanical, Industrial, and Nuclear Engineering, University of Cincinnati, Cincinnati
关键词
D O I
10.1109/23.506676
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
To study the light yield non-proportionality of inorganic scintillation materials, a Compton coincidence experiment has been designed and implemented. The coincidence technique is used to measure the nearly mono-energetic scintillator electron response by recording events only when energetic electrons are produced by gamma rays that are Compton scattered through a specific angle. This technique provides the ability to accurately determine the light yield non-proportionality of scintillation materials as a function of electron energy while minimizing the potential complicating effects of surface interactions and X-ray escape. To benchmark the Compton Coincidence Technique (CCT), the electron response for NaI(T1) has been measured for electron energies from 2 keV to 450 keV and compared to previously-published analytical and measured light yield electron responses. These CCT results are believed to be the most accurate NaI(T1) electron response measurements to date for energies below 20 keV where the light yield non-proportionality is most pronounced.
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页码:1271 / 1276
页数:6
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