InGaN RGB Light-Emitting Diodes With Monolithically Integrated Photodetectors for Stabilizing Color Chromaticity

被引:46
作者
Li, Kwai Hei [1 ]
Cheung, Yuk Fai [1 ]
Jin, Weijian [1 ]
Fu, Wai Yuen [1 ]
Lee, Albert Ting Leung [1 ]
Tan, Siew Chong [1 ]
Hui, Shu Yuen [1 ]
Choi, Hoi Wai [1 ]
机构
[1] Univ Hong Kong, Dept Elect & Elect Engn, Hong Kong, Peoples R China
基金
中国国家自然科学基金;
关键词
Color; Light emitting diodes; System-on-chip; Lighting; Photoconductivity; Temperature measurement; Quantum well devices; Color chromaticity; gallium nitride (GaN); light-emitting diode; monolithic integration; photodetector; RELIABILITY;
D O I
10.1109/TIE.2019.2926038
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, a solution toward realizing color chromaticity stabilized InGaN red, green, and blue (RGB) light-emitting diode (LED) is proposed and demonstrated. The InGaN/GaN multiple quantum wells (play a key role in light emission from the LEDs and photodetection from the photodetectors (PDs). The spectral overlaps between the emission and absorption spectra are measured and the photocurrents of the PDs exhibit linear behavior with increasing LED driving currents. The solution involves the use of RGB chips with monolithically integrated PDs that detect the levels of light output from an individual chip in real time, whose photocurrent signals are fed to LED driver circuits that make use of the signal to provide a driving current that stabilizes the light output. Adoption of this feedback strategy results in CIE coordinates drifts of Delta(0.003, 0.005) over the 400 h duration of testing, proving to be an effective way of stabilizing color chromaticity from RGB LEDs.
引用
收藏
页码:5154 / 5160
页数:7
相关论文
共 29 条
[1]  
[Anonymous], FLUCTUATION PHENOMEN
[2]  
[Anonymous], PNNL22759
[3]  
[Anonymous], PNNL21594
[4]  
[Anonymous], SLVAE09 TEX INSTR
[5]  
[Anonymous], C78377 ANSI
[6]  
[Anonymous], LED LUM REL REL IMP
[7]  
[Anonymous], SOL STAT LIGHT TECHN
[8]  
[Anonymous], P DOE SOL STAT LIGHT
[9]  
[Anonymous], PNNLSA23984
[10]   Light emitting diodes reliability review [J].
Chang, Moon-Hwan ;
Das, Diganta ;
Varde, P. V. ;
Pecht, Michael .
MICROELECTRONICS RELIABILITY, 2012, 52 (05) :762-782