Dewetting of thin polymer films: an X-ray scattering study

被引：39

作者：

Muller-Buschbaum, P ^{[1
]}

Stamm, M ^{[1
]}

机构：

[1] Max Planck Inst Polymerforsch, D-55021 Mainz, Germany

来源：

PHYSICA B | 1998年 / 248卷

关键词：

dewetting; polymer; diffuse scattering; SFM;

D O I：

10.1016/S0921-4526(98)00238-5

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The surface morphology of different dewetting states of thin polymer films (polystyrene) on top of silicon substrates was investigated. With diffuse X-ray scattering in the region of total external reflection a high in-plane resolution was achieved. We observe a new nano-dewetting structure which coexists with the well known mesoscopic dewetting structures of holes, cellular pattern and drops. This nano-dewetting structure consists of small dimples with a diameter in the nanometer range. It results from the dewetting of a remaining ultra-thin polymer layer and can be explained with theoretical predictions of spinodal decomposition. The experimental results of the scattering study are confirmed with scanning-force microscopy measurements. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：229 / 237

页数：9

共 30 条

[1]

[Anonymous], 1988, PHASE TRANSITIONS CR

[2]

[Anonymous], PHYS REV

[3]

Born M., 2006, PRINCIPLES OPTICS

[4]

BROCHARDWYART F, 1991, CAN J PHYS, V68, P1984

[5] AN ULTRASMALL ANGLE SCATTERING INSTRUMENT FOR THE DORIS-III BYPASS [J].

GEHRKE, R .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (01) :455-458

[6] Influence of order in thin smectic polymer films on the structure at the surface [J].

Henn, G ;

Stamm, M ;

Poths, H ;

Rucker, M ;

Rabe, JP .

PHYSICA B, 1996, 221 (1-4) :174-184

[7] NONSPECULAR X-RAY REFLECTION FROM ROUGH MULTILAYERS [J].

HOLY, V ;

BAUMBACH, T .

PHYSICAL REVIEW B, 1994, 49 (15) :10668-10676

[8]

Israelachvili, 1991, INTERMOLECULAR SURFA

[9]

James R.W., 1962, OPTICAL PRINCIPLES D

[10]

Lekner J., 1987, THEORY REFLECTION

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