Non-Invasive Neutral Atom Density Measurements using fs-TALIF in a Magnetic Linear Plasma Device

被引：0
|
作者：
Dogariu, Arthur [1 ]
Evans, Eugene [2 ]
Vinoth, Sangeeta P. [2 ]
Cohen, Samuel A. [2 ]
机构：
[1] Princeton Univ, Mech & Aerosp Engn Dept, Princeton, NJ 08544 USA
[2] Princeton Plasma Phys Lab, Princeton, NJ 08540 USA
来源：
2021 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2021年
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We report on femtosecond TALIF measurements of neutral density in a mirror plasma device. We have measured H density down to 10(11) cm(-3), and the dynamics of the H neutrals in quasi-CW and pulsed plasma. (c) 2021 The Author(s)
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