Investigation of interactions between co-fired LTCC components

被引:28
作者
Birol, H [1 ]
Maeder, T [1 ]
Jacq, C [1 ]
Ryser, P [1 ]
机构
[1] Ecole Polytech Fed Lausanne, LPM, CH-1015 Lausanne, Switzerland
关键词
firing; microstructure final; electrical properties; LTCC;
D O I
10.1016/j.jeurceramsoc.2005.03.182
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In spite of many advantages it offers for micro-electronic packaging, the low temperature co-fired ceramic (LTCC) technology has yet certain issues to be solved. Physical and chemical reactions, for instance, within and between the passive electronic components (thick film conductors, resistors-TFR) and the LTCC tapes (green sheets) during processing are one of the major challenges of this technology. This study aims to better understand and control the nature of such interactions, which have a direct effect on properties. The work is conducted on PTC (positive temperature coefficient) resistors, which are screen printed on (co-fired) and in (buried) LTCC sheets and fired at various temperatures. The final properties such as temperature coefficient of resistance (TCR) and sheet resistance are evaluated in terms of processing parameters using scanning electron microscopy (SEM), dilatometry and electro dispersive X-ray (EDXS) analysis as characterization tools. The results show that the TFR properties of buried samples deviate more strongly from the expected values compared to those of co-fired ones. It is primarily related to the destroyed conductor and resistor tines, which is closely related to the entrapped gases in buried structures as a result of organic burnout of printed inks. (c) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:2065 / 2069
页数:5
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