Metrological characterization of a low-cost electroencephalograph for wearable neural interfaces in industry 4.0 applications

被引：0
|
作者：
Arpaia, Pasquale [1 ,2 ,3 ]
Callegaro, Luca [4 ]
Cultrera, Alessandro [4 ]
Esposito, Antonio [2 ,5 ]
Ortolano, Massimo [4 ,5 ]
机构：
[1] Univ Napoli Federico II, Dept Elect Engn & Informat Technol DI ETI, Naples, Italy
[2] Univ Napoli Federico II, Augmented Real Hlth Monitoring Lab ARHeMLab, Naples, Italy
[3] Univ Napoli Federico II, Ctr Interdipartimentale Ric Management Sanit & In, Naples, Italy
[4] INRIM Ist Nazl Ric Metrol, Str Cacce 91, Turin, Italy
[5] Politecn Torino, Dept Elect & Telecommun DET, Corso Duca Abruzzi 24, Turin, Italy
来源：
2021 IEEE INTERNATIONAL WORKSHOP ON METROLOGY FOR INDUSTRY 4.0 & IOT (IEEE METROIND4.0 & IOT) | 2021年
关键词：
neural interfaces; industry; 4.0; wearable system; metrological characterization; low-cost; BRAIN-COMPUTER INTERFACES; REALITY;
D O I：
10.1109/METROIND4.0IOT51437.2021.9488445
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
In this work. the calibration of a commercial, low-cost electroencephalograph (Olimex EEG-SMT) is presented. Several works report about many wearable neural interfaces based on this device. On the contrary, metrological characterization of this electroencephalograph is lacking. The work reports that preliminary calibration results on this device showed good linearity but also a magnitude error around 8%, with a substantial dependence on frequency. This may lead to incorrect interpretations of the harmonic content of the observed brain-generated electrical potentials. Consequently, for applications based on neural activity monitoring, a metrological calibration of the electroencephalograph is important. Moreover, the proposed calibration method can be adapted to other similar devices.
引用
收藏
页码：1 / 5
页数：5
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