Method for Characterizing Nanoscale Wear of Atomic Force Microscope Tips

被引:138
作者
Liu, Jingjing [1 ]
Notbohm, Jacob K. [2 ]
Carpick, Robert W. [3 ]
Turner, Kevin T. [1 ,2 ]
机构
[1] Univ Wisconsin, Mat Sci Program, Madison, WI 53706 USA
[2] Univ Wisconsin, Dept Mech Engn, Madison, WI 53706 USA
[3] Univ Penn, Dept Mech Engn & Appl Mech, Philadelphia, PA 19104 USA
基金
美国国家科学基金会;
关键词
tip; wear; atomic force microscopy; nanotribology; probe; ULTRANANOCRYSTALLINE DIAMOND PROBES; ASPERITY TRIBOCHEMICAL WEAR; DIP-PEN NANOLITHOGRAPHY; JKR-DMT TRANSITION; SILICON; ADHESION; MECHANISM; CARBON; FILMS;
D O I
10.1021/nn100246g
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Atomic force microscopy (AFM) is a powerful tool for studying tribology (adhesion, friction, and lubrication) at the nanoscale and is emerging as a critical tool for nanomanufacturing. However, nanoscale wear is a key limitation of conventional AFM probes that are made of silicon and silicon nitride (SiN(x)). Here we present a method for systematically quantifying tip wear, which consists of sequential contact-mode AFM scans on ultrananocrystalline diamond surfaces with intermittent measurements of the tip properties using blind reconstruction, adhesion force measurements, and transmission electron microscopy (TEM). We demonstrate direct measurement of volume loss over the wear test and agreement between blind reconstruction and TEM imaging. The geometries of various types of tips were monitored over a scanning distance of approximately 100 mm. The results show multiple failure mechanisms for different materials, including nanoscale fracture of a monolithic Si tip upon initial engagement with the surface, film failure of a SiN(x)-coated Si tip, and gradual, progressive wear of monolithic SiN(x) tips consistent with atom-by-atom attrition. Overall, the method provides a quantitative and systematic process for examining tip degradation and nanoscale wear, and the experimental results illustrate the multiple mechanisms that may lead to tip failure.
引用
收藏
页码:3763 / 3772
页数:10
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