A Flexible PCB Inspection System Based on Statistical Learning

被引:19
作者
Liao, Chia-Te [1 ]
Lee, Wen-Hao [1 ]
Lai, Shang-Hong [1 ]
机构
[1] Natl Tsing Hua Univ, Dept Comp Sci, Hsinchu 300, Taiwan
来源
JOURNAL OF SIGNAL PROCESSING SYSTEMS FOR SIGNAL IMAGE AND VIDEO TECHNOLOGY | 2012年 / 67卷 / 03期
关键词
PCB; SVM; Automated visual inspection; Image classification; Defect classification; Image alignment; AUTOMATED VISUAL INSPECTION; PRINTED-CIRCUIT BOARDS; MULTICLASS CLASSIFICATION; NETWORKS; IMAGES; MODEL;
D O I
10.1007/s11265-010-0556-8
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
With the large variations in appearance for different kinds of defects in Printed Circuit Boards (PCBs), conventional rule-based inspection algorithms become insufficient for detecting and classifying defects. In this study, an automated PCB inspection system based on statistical learning strategies is developed. First, the partial Hausdorff distance is used to ascertain the positions of defects. Next, the defect patterns are categorized using the Support Vector Machine (SVM) classifier. Defects without regularities in appearance, which cannot be categorized, are identified through the regional defectiveness by comparing the block-wise probability distributions. Experimental results on a real visual inspection platform show that the proposed system is very effective for inspecting a variety of PCB defects.
引用
收藏
页码:279 / 290
页数:12
相关论文
共 29 条
[21]  
Scholkopf Bernhard, 2001, Learning with Kernels |
[22]   COMPUTER VISION FOR AUTOMATIC INSPECTION OF COMPLEX METAL PATTERNS ON MULTICHIP MODULES (MCM-D) [J].
SEAMAN, ME ;
ECONOMIKOS, L .
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING, 1995, 18 (04) :675-684
[23]  
Spence H. F., 1993, P IEEE SYST READ TEC, P41
[24]   Reflectance-based material classification for printed circuit boards [J].
Tominaga, S ;
Okamoto, S .
12TH INTERNATIONAL CONFERENCE ON IMAGE ANALYSIS AND PROCESSING, PROCEEDINGS, 2003, :238-244
[25]   SURFACE IDENTIFICATION USING THE DICHROMATIC REFLECTION MODEL [J].
TOMINAGA, S .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1991, 13 (07) :658-670
[26]  
Vapnik V., 1998, Statistical Learning Theory, P5
[27]  
Widrow B., 1960, IRE WESCON CONV RE 4, P96
[28]  
Wu TF, 2004, J MACH LEARN RES, V5, P975
[29]   Automated inspection of printed circuit boards through machine vision [J].
Wu, WY ;
Wang, MJJ ;
Liu, CM .
COMPUTERS IN INDUSTRY, 1996, 28 (02) :103-111