Parametric analysis applied to photothermal radiometry under random excitation

The object of the work that we present here, is to approach the new possibilities given by the coupling of parametric analysis and photothermal radiometry under random excitation. We show first, that this coupling allows to obtain an analysis mode more complete than the correlation mode of analysis. We show then, with the help of the studying of a particular sample, that this coupling allows to obtain rapidly, a good approximation of the multifrequencies harmonic response of materials. We show finally, that this coupling gives access to a multifrequencies photothermal imagery.