Surface plasmon resonance enhanced photoconductivity in Cu nanoparticle films

被引：4

作者：

Yang, Ki Youl ^{[1
]}

Choi, Kyung Cheol ^{[1
]}

Kang, Il-Suk ^{[2
]}

Ahn, Chi Won ^{[2
]}

机构：

[1] Korea Adv Inst Sci & Technol, Dept Elect Engn, Taejon 305701, South Korea

[2] Natl Nanofab Ctr, Taejon 305701, South Korea

来源：

OPTICS EXPRESS | 2010年 / 18卷 / 16期

关键词：

ELECTRICAL-CONDUCTION; COMPOSITE FILMS; METAL; PERCOLATION; TRANSPORT; BEHAVIOR;

D O I：

10.1364/OE.18.016379

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We describe an all-electrical plasmon detection based on the near field coupling between plasmons and percolating electrons. It is the technique to electrically detect the local field enhancement from randomly distributed Cu nanoparticles coupled to a plasmon resonance. In addition, we revealed that plasmon-sensitivity is maximized at the percolation threshold, the minimum Cu particle surface coverage which can make the percolation path through the particles. Our detectors have a simple structure for easy fabrication and a high level of sensitivity to plasmon resonance. (C) 2010 Optical Society of America

引用

页码：16379 / 16386

页数：8

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