Accurate charge density data collection in under a day with a home X-ray source

被引：19

作者：

Zhurov, VV

Zhurova, EA

Chen, YS

Pinkerton, AA ^{[1
]}

机构：

[1] Univ Toledo, Dept Chem, Toledo, OH 43606 USA

[2] LY Karpov Phys Chem Res Inst, Moscow 103064, Russia

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2005年 / 38卷

关键词：

D O I：

10.1107/S002188980501856X

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Accurate charge density data for pentaerythritol were measured at 15 K in the laboratory in under a day using a Rigaku R-Axis Rapid high-power rotating-anode diffractometer with a curved image-plate detector, and open-flow liquid-helium cryostat. The experimental procedure and data treatment are briefly described, and data quality evaluated based on a number of criteria.

引用

页码：827 / 829

页数：3

共 21 条

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