SERS spectra of polyaniline thin films deposited on rough Ag, Au and Cu. Polymer film thickness and roughness parameter dependence of SERS spectra

被引:146
作者
Baibarac, M
Cochet, M
Lapkowski, M
Mihut, L
Lefrant, S
Baltog, I
机构
[1] Natl Inst Mat Phys, Lab 160, R-76900 Bucharest, Romania
[2] Silesian Tech Univ, Dept Chem, PL-44100 Gliwice, Poland
[3] Universite Nantes, UMR CNRS, Lab Phys Cristalline, Inst Mat Nantes, F-44322 Nantes, France
关键词
polyaniline; surface-enhanced Raman scattering; roughness;
D O I
10.1016/S0379-6779(98)00065-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Surface-enhanced Raman scattering (SERS) has lately proved to be an effective technique which has led to its increasing application for studying the structural properties of conducting polymer thin films. It is generally accepted that the enhancement process has an electromagnetic origin arising from the excitation of surface plasmons (SPs) in the metal support on which the polymer film is deposited. However, the electromagnetic enhancement is also accompanied by a chemical process, on which only scarce experimental data are available at present. The chemical process originates in an increased polarizability of the molecules at the metal surface under the action of an incident radiation, as a result of which new chemical bonds are formed with the atoms of the metal support. This paper is devoted to the study of the SERS spectra under 1064 nm excitation for two forms of polyaniline, one of the emeraldine base type and the other of the emeraldine salt type. Our purpose has been to identify the chemical effects at the polymer/metal interface that are involved in specific modifications of the SERS spectra. The following results concerning SERS spectrum variation with metal support type (AE, Au and Cu) have been obtained. An oxidation of emeraldine base taking place at the polymer/metal interface has been revealed. In the case of emeraldine salt, an oxidized form of polyaniline, the SERS spectra remain unchanged regardless of the changes in the metal support, which proves the stability of this form. A new result has been obtained as SERS spectroscopy revealed an electron delocalization process taking place in the emeraldine salt molecule as a result of an electron transfer from metal to the polymer molecule occurring on the level of quinoid rings. The concept of a rough Raman-active surface has been clarified by using a parameter Wa, similar to the grating groove depth/grating periodicity ratio which occurs when a diffraction grating is used as optic coupler. (C) 1998 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:63 / 70
页数:8
相关论文
共 17 条
[1]  
BAIBARAC M, IN PRESS J RAMAN SPE
[2]   SURFACE-ENHANCED RAMAN-SCATTERING ON SILVER GRATING - OPTIMIZED ANTENNALIKE GAIN OF THE STOKES SIGNAL OF 10(4) [J].
BALTOG, I ;
PRIMEAU, N ;
REINISCH, R ;
COUTAZ, JL .
APPLIED PHYSICS LETTERS, 1995, 66 (10) :1187-1189
[3]   INSITU RAMAN STUDIES OF POLYPYRROLE FORMATION ON A SILVER ELECTRODE [J].
BUKOWSKA, J ;
JACKOWSKA, K .
ELECTROCHIMICA ACTA, 1990, 35 (02) :315-317
[4]  
HUE G, 1994, MACROMOL RAPID COMM, V15, P99
[5]  
HUTLEY MC, 1981, OPT COMMUN, V19, P122
[6]   SURFACE-PLASMON ENHANCED RAMAN-SPECTRA OF MONOLAYER ASSEMBLIES [J].
KNOLL, W ;
PHILPOTT, MR ;
SWALEN, JD ;
GIRLANDO, A .
JOURNAL OF CHEMICAL PHYSICS, 1982, 77 (05) :2254-2259
[7]   RADIATIVE DECAY OF NON RADIATIVE SURFACE PLASMONS EXCITED BY LIGHT [J].
KRETSCHM.E ;
RAETHER, H .
ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1968, A 23 (12) :2135-&
[8]   INSITU RAMAN STRUCTURAL STUDY OF POLYPYRROLE THIN-FILMS PREPARED BY ELECTROPOLYMERIZATION ON VARIOUS SUBSTRATES [J].
MARSAULT, JP ;
FRAOUA, K ;
AEIYACH, S ;
AUBARD, J ;
LEVI, G ;
LACAZE, PC .
JOURNAL DE CHIMIE PHYSIQUE ET DE PHYSICO-CHIMIE BIOLOGIQUE, 1992, 89 (05) :1167-1172
[9]   SURFACE-ENHANCED RAMAN-SCATTERING OF OBLIQUELY EVAPORATED AG FILMS [J].
MARTINEZ, JL ;
GAO, Y ;
LOPEZRIOS, T .
PHYSICAL REVIEW B, 1986, 33 (08) :5917-5919
[10]   KINETICS OF THE POLYPYRROLE ELECTROGENERATION FROM AQUEOUS-SOLUTION - AN EXSITU MICROGRAVIMETRIC STUDY [J].
OTERO, TF ;
SANTAMARIA, C .
ELECTROCHIMICA ACTA, 1992, 37 (02) :297-307