Effective Image and Spectral Data Acquisition Method Used in Scanning Near-field Optical Microscopy by Bimorph-based Shear Force Sensor

被引：0
|
作者：
Cai, Wei [1 ]
Yang, Mu [1 ]
Wang, Yingjie [1 ]
Shang, Guangyi [1 ]
机构：
[1] Beihang Univ, Dept Appl Phys, BUAA, Beijing 100191, Peoples R China
来源：
2013 IEEE INTERNATIONAL CONFERENCE ON IMAGING SYSTEMS AND TECHNIQUES (IST 2013) | 2013年
关键词：
scanning near-field optical microscopy; shear force microscopy; bimorph shear force sensor; near-field spectroscopy;
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
We have introduced a home-made scanning near-field optical microscope (SNOM) with bimorph-based shear force sensor. The instrumentation of the imaging system and the key techniques such as the bimorph-based non-optical shear force sensor design and the fabrication of optical fiber probes used in this SNOM are described in details. Then the good performance of the system is demonstrated by various experiments such as shear force imaging, near-field optical imaging, surface plasmon resonance detection, and near-field spectroscopy. The imaging and spectroscopic experimental results suggest that this home-made SNOM and bimorph-based shear force detection method would be promising techniques to be used in a variety of nanomaterials research and their optical applications.
引用
收藏
页码：155 / 159
页数：5
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