Deep Metallic Surface Defect Detection: The New Benchmark and Detection Network

被引:230
作者
Lv, Xiaoming [1 ]
Duan, Fajie [1 ]
Jiang, Jia-jia [1 ]
Fu, Xiao [1 ]
Gan, Lin [1 ]
机构
[1] Tianjin Univ, State Key Lab Precis Measuring Technol & Instrume, Tianjin 300072, Peoples R China
关键词
surface defect detection; convolutional neural network; object detection; CLASSIFICATION; IMAGES; INSPECTION;
D O I
10.3390/s20061562
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Metallic surface defect detection is an essential and necessary process to control the qualities of industrial products. However, due to the limited data scale and defect categories, existing defect datasets are generally unavailable for the deployment of the detection model. To address this problem, we contribute a new dataset called GC10-DET for large-scale metallic surface defect detection. The GC10-DET dataset has great challenges on defect categories, image number, and data scale. Besides, traditional detection approaches are poor in both efficiency and accuracy for the complex real-world environment. Thus, we also propose a novel end-to-end defect detection network (EDDN) based on the Single Shot MultiBox Detector. The EDDN model can deal with defects with different scales. Furthermore, a hard negative mining method is designed to alleviate the problem of data imbalance, while some data augmentation methods are adopted to enrich the training data for the expensive data collection problem. Finally, the extensive experiments on two datasets demonstrate that the proposed method is robust and can meet accuracy requirements for metallic defect detection.
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收藏
页数:15
相关论文
共 39 条
  • [1] Saliency-Based Defect Detection in Industrial Images by Using Phase Spectrum
    Bai, Xiaolong
    Fang, Yuming
    Lin, Weisi
    Wang, Lipo
    Ju, Bing-Feng
    [J]. IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, 2014, 10 (04) : 2135 - 2145
  • [2] Benhimane S, 2008, VISAPP 2008: PROCEEDINGS OF THE THIRD INTERNATIONAL CONFERENCE ON COMPUTER VISION THEORY AND APPLICATIONS, VOL 2, P337
  • [3] An Optical Surface Inspection and Automatic Classification Technique Using the Rotated Wavelet Transform
    Borwankar, Raunak
    Ludwig, Reinhold
    [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2018, 67 (03) : 690 - 697
  • [4] Defect inspection for TFT-LCD images based on the low-rank matrix reconstruction
    Cen, Yi-Gang
    Zhao, Rui-Zhen
    Cen, Li-Hui
    Cui, Li-Hong
    Miao, Zhen-Jiang
    Wei, Zhe
    [J]. NEUROCOMPUTING, 2015, 149 : 1206 - 1215
  • [5] Chen PH, 2016, IEEE IMAGE PROC, P749, DOI 10.1109/ICIP.2016.7532457
  • [6] Feature selection for surface defect classification of extruded aluminum profiles
    Chondronasios, Apostolos
    Popov, Ivan
    Jordanov, Ivan
    [J]. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2016, 83 (1-4) : 33 - 41
  • [7] Ding Shumin, 2011, 2011 International Conference on Multimedia Technology, P2903
  • [8] Scalable Object Detection using Deep Neural Networks
    Erhan, Dumitru
    Szegedy, Christian
    Toshev, Alexander
    Anguelov, Dragomir
    [J]. 2014 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), 2014, : 2155 - 2162
  • [9] Faghih-Roohi S, 2016, IEEE IJCNN, P2584, DOI 10.1109/IJCNN.2016.7727522
  • [10] Deep Multitask Learning for Railway Track Inspection
    Gibert, Xavier
    Patel, VishalM.
    Chellappa, Rama
    [J]. IEEE TRANSACTIONS ON INTELLIGENT TRANSPORTATION SYSTEMS, 2017, 18 (01) : 153 - 164