Bias-Induced Threshold Voltage Shifts in Organic Thin-Film Transistors by Soluble Fullerene Layers on Gate Dielectric

被引:3
作者
Mohamad, Khairul Anuar [1 ,2 ]
Uesugi, Katsuhiro [1 ]
Fukuda, Hisashi [1 ]
机构
[1] Muroran Inst Technol, Fac Engn, Div Engn Composite Funct, Muroran, Hokkaido 0508585, Japan
[2] Univ Malaysia Sabah, Sch Informat Technol & Engn, Kota Kinabalu 88999, Sabah, Malaysia
关键词
FIELD-EFFECT TRANSISTORS; STRESS;
D O I
10.1143/JJAP.50.01BC04
中图分类号
O59 [应用物理学];
学科分类号
摘要
An investigation of threshold voltage shifts in organic thin-film transistors (TFTs) based on pentacene with an additional soluble fullerene derivatives of [6,6]-phenyl C-61-butyric acid methyl ester (PCBM) on gate dielectric. With an additional soluble fullerene layer, the threshold voltage (V-th) is optimized from -3: 9 to -1:1 V without affect the mode operation of the devices, while retaining the carrier mobility (0.02-0.03 cm(2) V-1 s(-1)) and on/off current ratio (similar to 10(4)). Furthermore, the existence of PCBM agglomerates as electron acceptor-like traps resulted in a shift of Vth in the positive and reversible directions depending on the magnitude of gate bias (V-bias) as well as duration of time bias (T-bias). The device operation changed into normally-on (depletion-accumulation) mode upon positive Vbias as the duration of Tbias was increased, which attributes to the formation of a conductive layer at the pentacene-fullerene interface. Moreover, the recovery of Vth was further enhanced by a high negative V-bias for a short duration. In addition, the mobility was minimally affected by both Vbias conditions. (C) 2011 The Japan Society of Applied Physics
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页数:4
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