Fresnel zone-plate based X-ray microscopy in Zernike phase contrast with sub-50 nm resolution at NSRL

被引：4

作者：

Chen, Jie ^{[1
]}

Li, Wenjie ^{[1
]}

Liu, Yijin ^{[2
]}

Yue, Zhengbo ^{[3
]}

Tian, Jinping ^{[1
]}

Liu, Longhua ^{[1
]}

Xiong, Ying ^{[1
]}

Liu, Gang ^{[1
]}

Wane, Chunru ^{[4
]}

Wu, Ziyu ^{[1
]}

Yu, Hanging ^{[3
]}

Tian, Yangchao ^{[1
]}

机构：

[1] Univ Sci & Technol China, Sch Chem, Natl Synchrotron Radiat Lab, Hefei 230029, Anhui, Peoples R China

[2] Univ Sci & Technol China, Sch Chem, Dept Phys, Hefei 230029, Anhui, Peoples R China

[3] Univ Sci & Technol China, Sch Chem, Lab Environm Engn, Hefei 230029, Anhui, Peoples R China

[4] Chinese Acad Sci, Inst Chem, Beijing 10060, Peoples R China

来源：

9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY | 2009年 / 186卷

基金：

美国国家科学基金会;

关键词：

D O I：

10.1088/1742-6596/186/1/012005

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A transmission X-ray microscope using Fresnel zone-plates (FZPs) has been installed at U7A beamline of National Synchrotron Radiation Laboratory (NSRL). The objective FZP with 45 nm outermost zone width delivers a sub-50 nm resolution. A gold phase ring with 2.5 gm thickness and 4 pm width was placed at the focal plane of the objective FZP at 8 keV to produce a negative Zemike phase contrast. A series of samples were used to test the performance of the Zemike phase contrast X-ray microscopy.

引用

页数：3

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