Optical properties of Pb (Zr0.52Ti0.48) O3/BiFeO3 multilayers with ZnO buffer layer

被引:11
作者
Dutta, Shankar [1 ]
Pandey, Akhilesh [1 ]
Jindal, Kajal [2 ]
Thakur, O. P. [1 ]
Gupta, Vinay [2 ]
Chatterjee, Ratnamala [3 ]
机构
[1] Solid State Phys Lab, Delhi 110054, India
[2] Univ Delhi, Dept Phys, New Delhi 110007, India
[3] IIT Delhi, Dept Phys, New Delhi 110016, India
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2015年 / 120卷 / 01期
关键词
BIFEO3; THIN-FILMS; ENHANCED FERROELECTRIC PROPERTIES; PHOTOLUMINESCENCE PROPERTIES; MULTIFERROICS; DEPOSITION;
D O I
10.1007/s00339-015-9168-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper discussed about the optical properties of the PZT-BFO multilayer thin films, deposited with or without ZnO buffer layer. The elemental distribution of the PZT and BFO layers is found to vary across the thickness of the multilayer films. Raman spectroscopy measurement of both the multilayers samples has showed no sharp peaks due to the polycrystalline nature of the films and partial overlap of the Raman peaks of individual PZT and BFO layers. Photoluminescence study of the buffered film showed peaks at 400, 525, and 580 nm, whereas the un-buffered film showed PL peaks at 405 and 530 nm. The peak at 580 nm appears to be due to the ZnO buffer layer. The ZnO-buffered thin film shows more intense Raman and photoluminescence peaks compared with the thin film with no buffer. The absorption spectra of the PZT-BFO multilayers under the mid-IR radiations showed a sharp peak at 690 cm(-1) in both the samples. It might be due to the structural rearrangement of the BO6 and AO(12) units resulting in perovskite phase (ABO(3)) formation.
引用
收藏
页码:53 / 58
页数:6
相关论文
共 31 条
[1]   Effect of In and Mn co-doping on structural, magnetic and dielectric properties of BiFeO3 nanoparticles [J].
Arya, G. S. ;
Negi, N. S. .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2013, 46 (09)
[2]   Tailoring the morphology of electrodeposited ZnO and its photoluminescence properties [J].
Cui, H. ;
Mollar, M. ;
Mari, B. .
OPTICAL MATERIALS, 2011, 33 (03) :327-331
[3]   Estimation of residual stress in Pb(Zr0.52Ti0.48)O3/BiFeO3 multilayers deposited on silicon [J].
Dutta, Shankar ;
Pandey, Akhilesh ;
Thakur, O. P. ;
Pal, Ramjay ;
Chatterjee, Ratnamala .
JOURNAL OF APPLIED PHYSICS, 2013, 114 (17)
[4]   Improved electrical properties of PbZrTiO3/BiFeO3 multilayers with ZnO buffer layer [J].
Dutta, Shankar ;
Pandey, Akhilesh ;
Yadav, I. ;
Thakur, O. P. ;
Laishram, R. ;
Pal, Ramjay ;
Chatterjee, Ratnamala .
JOURNAL OF APPLIED PHYSICS, 2012, 112 (08)
[5]   Heteroepitaxial growth of PZT thin films on LiF substrate by pulsed laser deposition [J].
Hamedi, LH ;
Guilloux-Viry, M ;
Perrin, A ;
Garry, G .
THIN SOLID FILMS, 1999, 352 (1-2) :66-72
[6]   Multiferroic BiFeO3 thin films processed via chemical solution deposition:: Structural and electrical characterization -: art. no. 094901 [J].
Iakovlev, S ;
Solterbeck, CH ;
Kuhnke, M ;
Es-Souni, M .
JOURNAL OF APPLIED PHYSICS, 2005, 97 (09)
[7]   Fabrication and Electrical Properties of PZT/BFO Multilayer Thin Films [J].
Jo, Seo-Hyeon ;
Nam, Sung-Pil ;
Lee, Sung-Gap ;
Lee, Seung-Hwan ;
Lee, Young-Hie ;
Kim, Young-Gon .
TRANSACTIONS ON ELECTRICAL AND ELECTRONIC MATERIALS, 2011, 12 (05) :193-196
[8]   Ferroelectric properties of PZT/BFO multilayer thin films prepared using the sol-gel method [J].
Jo, Seo-Hyeon ;
Lee, Sung-Gap ;
Lee, Young-Hie .
NANOSCALE RESEARCH LETTERS, 2012, 7 :1-5
[9]   Observation of structural transitions and Jahn-Teller distortion in LaMnO3-doped BiFeO3 thin films [J].
Kartopu, G. ;
Lahmar, A. ;
Es-Souni, M. .
APPLIED PHYSICS LETTERS, 2008, 92 (15)
[10]   Raman scattering study of polycrystalline magnetoelectric BiFeO3 [J].
Kothari, Deepti ;
Reddy, V. Raghavendra ;
Sathe, V. G. ;
Gupta, Ajay ;
Banerjee, A. ;
Awasthi, A. M. .
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2008, 320 (3-4) :548-552