Thermal Conductivity Spectroscopy Technique to Measure Phonon Mean Free Paths

被引：439

作者：

Minnich, A. J. ^{[1
]}

Johnson, J. A. ^{[2
]}

Schmidt, A. J. ^{[3
]}

Esfarjani, K. ^{[1
]}

Dresselhaus, M. S. ^{[4
,5
]}

Nelson, K. A. ^{[2
]}

Chen, G. ^{[1
]}

机构：

[1] MIT, Dept Mech Engn, Cambridge, MA 02139 USA

[2] MIT, Dept Chem, Cambridge, MA 02139 USA

[3] Boston Univ, Dept Mech Engn, Boston, MA 02215 USA

[4] MIT, Dept Elect Engn, Cambridge, MA 02139 USA

[5] MIT, Dept Phys, Cambridge, MA 02139 USA

来源：

PHYSICAL REVIEW LETTERS | 2011年 / 107卷 / 09期

关键词：

THERMOELECTRIC PERFORMANCE; SILICON NANOWIRES; HEAT; NANOSCALE;

D O I：

10.1103/PhysRevLett.107.095901

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Size effects in heat conduction, which occur when phonon mean free paths (MFPs) are comparable to characteristic lengths, are being extensively explored in many nanoscale systems for energy applications. Knowledge of MFPs is essential to understanding size effects, yet MFPs are largely unknown for most materials. Here, we introduce the first experimental technique which can measure MFP distributions over a wide range of length scales and materials. Using this technique, we measure the MFP distribution of silicon for the first time and obtain good agreement with first-principles calculations.

引用

页数：4

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