Ultrafast Single-particle Imaging with Intense X-ray Pulses

被引：2

作者：

Sun, Zhibin ^{[1
]}

Al Haddad, Andre ^{[1
]}

Augustin, Sven ^{[1
]}

Knopp, Gregor ^{[1
]}

Knurr, Jonas ^{[1
]}

Schnorr, Kirsten ^{[1
]}

Bostedt, Christoph ^{[1
,2
]}

机构：

[1] Paul Scherrer Inst PSI, CH-5232 Villigen, Switzerland

[2] Ecole Polytech Fed Lausanne, LUXS Lab Ultrafast X Ray Sci, CH-1015 Lausanne, Switzerland

来源：

CHIMIA | 2022年 / 76卷 / 06期

基金：

瑞士国家科学基金会;

关键词：

Ultrafast imaging; Free-electron laser; X-ray; FEMTOSECOND;

D O I：

10.2533/chimia.2022.529

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Ultrafast single-particle imaging with intense x-ray pulses from free-electron laser sources provides a new approach for visualizing structure and dynamics on the nanoscale. After a short introduction to the novel free-electron laser sources and methods, we highlight selected applications and discuss how ultrafast imaging flourishes from method development to early applications in physics and biology to opportunities for chemical sciences.

引用

页码：529 / 537

页数：9

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