Development of Machine Vision System for Off-Line Inspection of Fine Defects on Glass Screen Surface

被引:9
作者
Yang, Weilin [1 ]
Zhang, Yongwei [1 ]
Dong, Yue [2 ]
Xu, Dezhi [1 ]
Pan, Tinglong [1 ]
机构
[1] Jiangnan Univ, Sch Internet Things Engn, Dept Automat, Wuxi 214122, Jiangsu, Peoples R China
[2] Jiangnan Univ, Sch Internet Things Engn, Dept Elect Engn, Wuxi 214122, Jiangsu, Peoples R China
基金
中国国家自然科学基金;
关键词
Deep learning; fine defects; glass screen surface; machine vision; CONTOUR;
D O I
10.1109/TIM.2022.3190052
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The complicated manufacturing process and poor industrial environment inevitably produce unacceptable scratches on glass screen surface. In this study, a machine vision system is developed to automatically detect fine scratch, which has a width smaller than 30 mu m, on glass screen surface for the purpose of appearance quality assessment. The imaging hardware of the proposed machine vision system is made up of a high-resolution camera and a wide field lens so that a high-quality image is achieved in a relatively large image area. The captured glass screen images were first classified with YOLOv3 to exactly distinguish fine scratches in two other kinds of defects including dusts and stains. Then, the U-Net network was applied on the selected scratches to estimate their dimensions approximately. The proposed algorithms combination has a fast image processing speed and it is able to effectively reduce the false segmentation of other defects. The results of the developed machine vision system show a relatively good agreement with the well-established microscopic method. It demonstrates our machine vision method is able to image and quantitatively analyze scratches with dimensions between 25 and 100 mu m.
引用
收藏
页数:8
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