Automatic system to measure complex permittivity and permeability using cavity perturbation techniques

被引：0

作者：

Ye, Yan ^{[1
]}

Sklyuyev, Andrey ^{[1
]}

Akyel, Cevdet ^{[1
]}

Ciureanu, Petru ^{[2
]}

机构：

[1] Ecole Polytech, Dept Genie Elect, CP 6079,Succ Ctr Ville, Montreal, PQ H3C 3A7, Canada

[2] Ecole Polytech, Dept Genie Phys, Montreal, PQ, Canada

来源：

2007 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5 | 2007年

关键词：

cavity perturbation; complex permittivity; complex permeability; magnetic wire;

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

A cavity perturbation technique suitable for measuring dielectric parameters of various dielectric materials and magnetic parameters of amorphous magnetic wires is discussed. From the shift in the resonant frequency and the Q-value, the complex permeability of the material can be calculated. Three different methods to determine the resonant frequency and the quality factor from complex transmission coefficient are used and compared to find which is most accurate and precise when tested using identical materials.

引用

页码：5 / +

页数：2

共 13 条

[1] NEW DEVELOPMENTS ON AUTOMATED-ACTIVE CIRCUITS FOR PERMITTIVITY MEASUREMENTS AT MICROWAVE-FREQUENCIES [J].

AKYEL, C ;

BOSISIO, RG .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1989, 38 (02) :496-504

[2]

[Anonymous], DATA REDUCTION ERROR

[3] MEASUREMENT OF SUSCEPTIBILITY TENSOR IN FERRITES [J].

ARTMAN, JO ;

TANNENWALD, PE .

JOURNAL OF APPLIED PHYSICS, 1955, 26 (09) :1124-1132

[4]

*ASTM STAND, 2005, D252001 ASTM STAND, P8

[5]

Bethe H. A., 1943, D1117 CORN U NAT DEF

[6] The dielectric relaxation of water between 0°C and 35°C [J].

Buchner, R ;

Barthel, J ;

Stauber, J .

CHEMICAL PHYSICS LETTERS, 1999, 306 (1-2) :57-63

[7] Circumferential and longitudinal 1 GHz permeabilities in Co-rich melt-extracted amorphous wires [J].

Ciureanu, P ;

Melo, LGC ;

Yelon, A .

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2002, 242 :224-228

[8]

HARRINGTON RF, 1961, TIME HARMONIC ELECTR, P344

[9]

MIURA T, 1994, IEICE T ELECTRON, VE77C, P900

[10] MEASUREMENT OF DIELECTRIC PARAMETERS AT MICROWAVE-FREQUENCIES BY CAVITY-PERTURBATION TECHNIQUE [J].

PARKASH, A ;

VAID, JK ;

MANSINGH, A .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1979, 27 (09) :791-795

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