Towards polarization analysis on a thermal time-of-flight spectrometer

被引：5

作者：

Stride, JA ^{[1
]}

Andersen, KH ^{[1
]}

Murani, AP ^{[1
]}

Mutka, H ^{[1
]}

Schober, H ^{[1
]}

Stewart, JR ^{[1
]}

机构：

[1] Inst Max Von Laue Paul Langevin, F-38042 Grenoble, France

来源：

PHYSICA B-CONDENSED MATTER | 2005年 / 356卷 / 1-4期

关键词：

thermal neutron scattering; inelastic scattering; time-of-flight;

D O I：

10.1016/j.physb.2004.10.066

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Making real the ambition of performing polarization analysis on a thermal time-of-flight (TOF) spectrometer has been under discussion for several years. Recent developments at the ILL have brought this goal closer and we are now confident that full XYZ-PA can be installed on the existing thermal TOF spectrometer IN4 at ILL. We present here a brief discussion of these developments and highlight the methods foreseen in order to arrive at Polarization Analysis on a Thermal tof Inelastic Spectrometer (PASTIS). (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：146 / 149

页数：4

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