High-resolution Angle Measurement based on Michelson Interferometry

被引:17
作者
Cheng, Fang [1 ]
Fan, Kuang-Chao [2 ]
机构
[1] Nanyang Technol Univ, Sch Mech & Aerosp Engn, Singapore 639798, Singapore
[2] Natl Taiwan Univ, Dept Mech Engn, Taipei 10617, Taiwan
来源
INTERNATIONAL CONFERENCE ON OPTICS IN PRECISION ENGINEERING AND NANOTECHNOLOGY (ICOPEN 2011) | 2011年 / 19卷
关键词
Michelson interferometer; angular displacement; optical bonding; alignment tolerance;
D O I
10.1016/j.phpro.2011.06.118
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper a reconfigured Michelson interferometer for high-resolution angle measurement is proposed. The anglular displacement of the object mirror will cause optical path difference that generates interference. With an optical phase shift module the photodetectors will collect quadrature signals with 90 phase shift. With pulse counting and phase subdivision processing the optical path change can be calculated and then converted to anglular displacement. The proposed structure is also featured by its miniature design. The optical system is only 55mm by 55mm in area. In order to facilitate the alignment of optical components and improve the signal quality, a new optical bonding technology by mechanical fixture is proposed so that the optics can be permanently pressed together without air gap in between. Experiments show that the resolution is 0.01", the accuracy is less than 0.03", and the repeatability is within 0.1" for the measurement range of perpendicular to 50 arc seconds. (C) 2011 Published by Elsevier B.V. Selection and/or peer-review under responsibility of the Organising Committee of the ICOPEN 2011 conference
引用
收藏
页数:6
相关论文
共 16 条
[1]  
[Anonymous], 2006, NANOTECHNOLOGY PRECI
[2]  
BRICH KP, 1990, PRECIS ENG, V12, P195
[3]  
CHENG F, 2008, P SPI, V7130, P6
[4]   Angle measurement using total-internal-reflection heterodyne interferometry [J].
Chiu, MH ;
Su, DC .
OPTICAL ENGINEERING, 1997, 36 (06) :1750-1753
[5]   The structure design of a micro-precision CMM with Abbe principle [J].
Fan, K. C. ;
Liu, C. L. ;
Wu, P. T. ;
Chen, Y. C. ;
Wang, W. L. .
PROCEEDINGS OF THE 35TH INTERNATIONAL MATADOR CONFERENCE: FORMERLY THE INTERNATIONAL MACHINE TOOL DESIGN AND RESEARCH CONFERENCE, 2007, :297-+
[6]   A displacement spindle in a micro/nano level [J].
Fan, Kuang-Chao ;
Lai, Zi-Fa ;
Wu, Peitsung ;
Chen, Yung-Chang ;
Chen, Yejin ;
Jaeger, Gerd .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2007, 18 (06) :1710-1717
[7]   ANGLE MEASUREMENT BASED ON THE INTERNAL-REFLECTION EFFECT - A NEW METHOD [J].
HUANG, PS ;
KIYONO, S ;
KAMADA, O .
APPLIED OPTICS, 1992, 31 (28) :6047-6055
[8]  
HUANG PS, 1992, APPL OPTICS, V35, P2239
[9]   Michelson interferometer for precision angle measurement [J].
Ikram, M ;
Hussain, G .
APPLIED OPTICS, 1999, 38 (01) :113-120
[10]   FIBEROPTIC AUTOCOLLIMATION REFRACTOMETER [J].
ILEV, IK .
OPTICS COMMUNICATIONS, 1995, 119 (5-6) :513-516