The effects of oxide apertures on the characteristics of resonant-cavity light-emitting diodes

被引:0
作者
Yang, Wei [1 ]
Li, Jianjun [1 ]
Sun, Pei [1 ]
Ma, Lingyun [1 ]
机构
[1] Beijing Univ Technol, Key Lab Optoelect Technol, Beijing 100124, Peoples R China
来源
PHOTONICS AND OPTOLECTRONICS MEETINGS (POEM) 2011: OPTOELECTRONIC DEVICES AND INTEGRATION | 2011年 / 8333卷
关键词
resonant-cavity light-emitting diode; oxide aperture; TEMPERATURE;
D O I
10.1117/12.916261
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The 650nm oxide-confined RCLEDs (resonant-cavity light-emitting diodes) have been fabricated with different oxide aperture diameters. The oxide apertures, which could apply confinement of both the carrier distribution and the optical field, are created by lateral selective wet oxidation of AlAs layer in the p-DBR (distributed Bragg reflectors). All samples have the same diameter 80 mu m of the emission window defined by the circular electrodes, while their current apertures are defined by the oxidation apertures ranged from 90 mu m to 130 mu m, larger than the emission window. The maximum optical power is 1.909mW. The electrical and optical properties are systematically discussed for different oxide apertures. The greater voltage at 20mA is attained for smaller oxide-aperture devices as smaller oxide-aperture devices have greater series resistance due to the oxide layer. The maximum output power is reached rapidly for smaller oxide-aperture devices since smaller oxide-aperture devices have larger current density at the same current. The maximum output power of smaller oxide-aperture devices is lower than that of larger oxide-aperture devices. It is because that larger current density and greater series resistance could lead to greater Joule heat, which results in more injected electrons relax their energy by the way of nonradiation.
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页数:6
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