The effect of total reflection in PLIF imaging of annular thin films

被引：44

作者：

Haeber, Thomas ^{[1
]}

Gebretsadik, Mulubrhan ^{[1
]}

Bockhorn, Henning ^{[1
]}

Zarzalis, Nikolaos ^{[1
]}

机构：

[1] Karlsruhe Inst Technol, EBI, D-76131 Karlsruhe, Germany

来源：

INTERNATIONAL JOURNAL OF MULTIPHASE FLOW | 2015年 / 76卷

关键词：

Planar laser-induced fluorescence (PLIF); Film thicicness; Annular flow; Ray-tracing; LASER-INDUCED-FLUORESCENCE; GAS-LIQUID FLOW; PART I; 2-PHASE FLOW; THICKNESS; WAVES; INSTABILITIES; HYDRODYNAMICS; ANGLE; PIV;

D O I：

10.1016/j.ijmultiphaseflow.2015.06.009

中图分类号：

O3 [力学];

学科分类号：

08 ; 0801 ;

摘要：

Planar laser-induced fluorescence (PLIF) imaging techniques are increasingly used to study wavy annular flows in vertical and horizontal pipes. We present a ray-tracing study that analyzes the imaging properties of the PLIF technique for uniform and wavy annular films. Part of the emitted fluorescence will hit the water-air interface at angles greater than the critical angle of total reflection. As a consequence, PLIF imaging probes the film twice: From bottom to top and then again from top to bottom. Deflected fluorescence widens PLIF images of uniform films by about 30%. Surface waves further increase the contribution of deflected rays to the overall signal. At the steep slopes of large amplitude axial waves, total reflection might widen PLIF signals by up to a factor of two. (C) 2015 Elsevier Ltd. All rights reserved.

引用

页码：64 / 72

页数：9

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