On the testing quality of random and pseudo-random sequences for permanent and intermittent faults

被引:0
|
作者
Ding, J [1 ]
Wu, YL [1 ]
机构
[1] Beijing Univ Posts & Telecommun, Dept Telecommun, Beijing 100088, Peoples R China
关键词
D O I
10.1109/ASPDAC.1999.760021
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, the natures of random and pseudo-random input sequences and their influence on permanent and intermittent fault detecting are analyzed. The aliasing fault coverage between the pseudo-random and random sequences is estimated. The activity probability features of the intermittent faults are considered. The self-test circuits of the intermittent faults are illustrated. The experimental results based on real circuits are obtained through simulation. The mathematical analysis and experimental results show that the quality of the pseudorandom testing is better than that of the random testing for the permanent and intermittent faults. The Markov chain models are used in obtaining the input sequence length needed for determining if a circuit fault is intermittent or permanent.
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页码:311 / 314
页数:4
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