Paintings - high-energy protons detect pigments and paint-layers

被引:23
作者
Denker, A [1 ]
Opitz-Coutureau, J [1 ]
机构
[1] Hahn Meitner Inst Berlin GmbH, Ionenstrahllabor, D-14109 Berlin, Germany
关键词
high-energy PIXE; ion beam analysis; non-destructive analysis;
D O I
10.1016/S0168-583X(03)01685-9
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
High-energy PIXE was used to identify pigment composition, sequencing and the thickness of paint-layers. Before applying the technique to valuable masterpieces, mock-ups were examined in a collaboration with the Kunsthistorisches Museum, Vienna. The results of high-energy PIXE were compared to conventional cross-section analysis. In addition, the non-destructiveness of the technique was investigated thoroughly. After this preparative work, two ancient paintings have been examined and the results are presented in this paper. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:677 / 682
页数:6
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