共 19 条
rf-microwave switches based on reversible semiconductor-metal transition of VO2 thin films synthesized by pulsed-laser deposition
被引:110
作者:

Dumas-Bouchiat, F.
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h-index: 0
机构: Univ Limoges, CNRS, UMR 6638, SPCTS, F-87060 Limoges, France

Champeaux, C.
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h-index: 0
机构: Univ Limoges, CNRS, UMR 6638, SPCTS, F-87060 Limoges, France

Catherinot, A.
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机构: Univ Limoges, CNRS, UMR 6638, SPCTS, F-87060 Limoges, France

Crunteanu, A.
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h-index: 0
机构: Univ Limoges, CNRS, UMR 6638, SPCTS, F-87060 Limoges, France

Blondy, P.
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h-index: 0
机构: Univ Limoges, CNRS, UMR 6638, SPCTS, F-87060 Limoges, France
机构:
[1] Univ Limoges, CNRS, UMR 6638, SPCTS, F-87060 Limoges, France
[2] Univ Limoges, CNRS, UMR 6172, XLIM, F-87060 Limoges, France
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D O I:
10.1063/1.2815927
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
Microwave switching devices based on the semiconductor-metal transition of VO2 thin films were developped on two types of substrates (C-plane sapphire and SiO2/Si), and in both shunt and series configurations. Under thermal activation, the switches achieved up to 30-40 dB average isolation of the radio-frequency (rf) signal on 500 MHz-35 GHz frequency band with weak insertion losses. These VO2-based switches can be electrically activated with commutation times less than 100 ns, which make them promising candidates for realizing efficient and simple rf switches. (C) 2007 American Institute of Physics.
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共 19 条
[1]
Evidence for a structurally-driven insulator-to-metal transition in VO2:: A view from the ultrafast timescale -: art. no. 161102
[J].
Cavalleri, A
;
Dekorsy, T
;
Chong, HHW
;
Kieffer, JC
;
Schoenlein, RW
.
PHYSICAL REVIEW B,
2004, 70 (16)
:1-4

Cavalleri, A
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA

Dekorsy, T
论文数: 0 引用数: 0
h-index: 0
机构: Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA

Chong, HHW
论文数: 0 引用数: 0
h-index: 0
机构: Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA

Kieffer, JC
论文数: 0 引用数: 0
h-index: 0
机构: Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA

Schoenlein, RW
论文数: 0 引用数: 0
h-index: 0
机构: Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
[2]
Femtosecond structural dynamics in VO2 during an ultrafast solid-solid phase transition -: art. no. 237401
[J].
Cavalleri, A
;
Tóth, C
;
Siders, CW
;
Squier, JA
;
Ráksi, F
;
Forget, P
;
Kieffer, JC
.
PHYSICAL REVIEW LETTERS,
2001, 87 (23)
:237401-1

Cavalleri, A
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif San Diego, La Jolla, CA 92093 USA Univ Calif San Diego, La Jolla, CA 92093 USA

Tóth, C
论文数: 0 引用数: 0
h-index: 0
机构: Univ Calif San Diego, La Jolla, CA 92093 USA

Siders, CW
论文数: 0 引用数: 0
h-index: 0
机构: Univ Calif San Diego, La Jolla, CA 92093 USA

Squier, JA
论文数: 0 引用数: 0
h-index: 0
机构: Univ Calif San Diego, La Jolla, CA 92093 USA

Ráksi, F
论文数: 0 引用数: 0
h-index: 0
机构: Univ Calif San Diego, La Jolla, CA 92093 USA

Forget, P
论文数: 0 引用数: 0
h-index: 0
机构: Univ Calif San Diego, La Jolla, CA 92093 USA

Kieffer, JC
论文数: 0 引用数: 0
h-index: 0
机构: Univ Calif San Diego, La Jolla, CA 92093 USA
[3]
Abrupt metal-insulator transition observed in VO2 thin films induced by a switching voltage pulse
[J].
Chae, BG
;
Kim, HT
;
Youn, DH
;
Kang, KY
.
PHYSICA B-CONDENSED MATTER,
2005, 369 (1-4)
:76-80

Chae, BG
论文数: 0 引用数: 0
h-index: 0
机构:
Elect & Telecommun Res Inst, Basic Res Lab, Taejon 305350, South Korea Elect & Telecommun Res Inst, Basic Res Lab, Taejon 305350, South Korea

Kim, HT
论文数: 0 引用数: 0
h-index: 0
机构:
Elect & Telecommun Res Inst, Basic Res Lab, Taejon 305350, South Korea Elect & Telecommun Res Inst, Basic Res Lab, Taejon 305350, South Korea

Youn, DH
论文数: 0 引用数: 0
h-index: 0
机构:
Elect & Telecommun Res Inst, Basic Res Lab, Taejon 305350, South Korea Elect & Telecommun Res Inst, Basic Res Lab, Taejon 305350, South Korea

Kang, KY
论文数: 0 引用数: 0
h-index: 0
机构:
Elect & Telecommun Res Inst, Basic Res Lab, Taejon 305350, South Korea Elect & Telecommun Res Inst, Basic Res Lab, Taejon 305350, South Korea
[4]
Thermal dynamics of VO2 films within the metal-insulator transition:: Evidence for chaos near percolation threshold
[J].
de Almeida, LAL
;
Deep, GS
;
Lima, AMN
;
Neff, H
.
APPLIED PHYSICS LETTERS,
2000, 77 (26)
:4365-4367

de Almeida, LAL
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Fed Paraiba, Dept Elect Engn, BR-58109970 Campina Grande, PB, Brazil Univ Fed Paraiba, Dept Elect Engn, BR-58109970 Campina Grande, PB, Brazil

Deep, GS
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Fed Paraiba, Dept Elect Engn, BR-58109970 Campina Grande, PB, Brazil Univ Fed Paraiba, Dept Elect Engn, BR-58109970 Campina Grande, PB, Brazil

Lima, AMN
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Fed Paraiba, Dept Elect Engn, BR-58109970 Campina Grande, PB, Brazil Univ Fed Paraiba, Dept Elect Engn, BR-58109970 Campina Grande, PB, Brazil

Neff, H
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Fed Paraiba, Dept Elect Engn, BR-58109970 Campina Grande, PB, Brazil Univ Fed Paraiba, Dept Elect Engn, BR-58109970 Campina Grande, PB, Brazil
[5]
Reversible metal-semiconductor transitions for microwave switching applications - art. no. 073503
[J].
Dragoman, M
;
Cismaru, A
;
Hartnagel, H
;
Plana, R
.
APPLIED PHYSICS LETTERS,
2006, 88 (07)

Dragoman, M
论文数: 0 引用数: 0
h-index: 0
机构: CNRS, LAAS, F-31077 Toulouse 4, France

Cismaru, A
论文数: 0 引用数: 0
h-index: 0
机构: CNRS, LAAS, F-31077 Toulouse 4, France

Hartnagel, H
论文数: 0 引用数: 0
h-index: 0
机构: CNRS, LAAS, F-31077 Toulouse 4, France

Plana, R
论文数: 0 引用数: 0
h-index: 0
机构: CNRS, LAAS, F-31077 Toulouse 4, France
[6]
Cobalt cluster-assembled thin films deposited by low energy cluster beam deposition: Structural and magnetic investigations of deposited layers
[J].
Dumas-Bouchiat, F.
;
Nagaraja, H. S.
;
Rossignol, F.
;
Champeaux, C.
;
Trolliard, G.
;
Catherinot, A.
;
Givord, D.
.
JOURNAL OF APPLIED PHYSICS,
2006, 100 (06)

Dumas-Bouchiat, F.
论文数: 0 引用数: 0
h-index: 0
机构: CNRS, SPCTS, UMR 6637, Ctr Project Films Minces & Microdispositifs Telec, F-87060 Limoges, France

Nagaraja, H. S.
论文数: 0 引用数: 0
h-index: 0
机构: CNRS, SPCTS, UMR 6637, Ctr Project Films Minces & Microdispositifs Telec, F-87060 Limoges, France

Rossignol, F.
论文数: 0 引用数: 0
h-index: 0
机构: CNRS, SPCTS, UMR 6637, Ctr Project Films Minces & Microdispositifs Telec, F-87060 Limoges, France

Champeaux, C.
论文数: 0 引用数: 0
h-index: 0
机构: CNRS, SPCTS, UMR 6637, Ctr Project Films Minces & Microdispositifs Telec, F-87060 Limoges, France

Trolliard, G.
论文数: 0 引用数: 0
h-index: 0
机构: CNRS, SPCTS, UMR 6637, Ctr Project Films Minces & Microdispositifs Telec, F-87060 Limoges, France

Catherinot, A.
论文数: 0 引用数: 0
h-index: 0
机构: CNRS, SPCTS, UMR 6637, Ctr Project Films Minces & Microdispositifs Telec, F-87060 Limoges, France

Givord, D.
论文数: 0 引用数: 0
h-index: 0
机构: CNRS, SPCTS, UMR 6637, Ctr Project Films Minces & Microdispositifs Telec, F-87060 Limoges, France
[7]
Structural, electrical and optical properties of pulsed laser deposited VO2 thin films on R- and C-sapphire planes
[J].
Garry, G
;
Durand, O
;
Lordereau, A
.
THIN SOLID FILMS,
2004, 453
:427-430

Garry, G
论文数: 0 引用数: 0
h-index: 0
机构:
Thales Res & Technol, F-91404 Orsay, France Thales Res & Technol, F-91404 Orsay, France

Durand, O
论文数: 0 引用数: 0
h-index: 0
机构:
Thales Res & Technol, F-91404 Orsay, France Thales Res & Technol, F-91404 Orsay, France

Lordereau, A
论文数: 0 引用数: 0
h-index: 0
机构:
Thales Res & Technol, F-91404 Orsay, France Thales Res & Technol, F-91404 Orsay, France
[8]
Design, fabrication and testing of a micromachined thermo-optical light modulator based on a vanadium dioxide array
[J].
Jiang, L
;
Carr, WN
.
JOURNAL OF MICROMECHANICS AND MICROENGINEERING,
2004, 14 (07)
:833-840

Jiang, L
论文数: 0 引用数: 0
h-index: 0
机构:
New Jersey Inst Technol, Newark, NJ 07102 USA New Jersey Inst Technol, Newark, NJ 07102 USA

Carr, WN
论文数: 0 引用数: 0
h-index: 0
机构:
New Jersey Inst Technol, Newark, NJ 07102 USA New Jersey Inst Technol, Newark, NJ 07102 USA
[9]
Sub-microsecond RF MEMS switched capacitors
[J].
Lacroix, Benjamin
;
Pothier, Arnaud
;
Crunteanu, Aurelian
;
Cibert, Christophe
;
Dumas-Bouchiat, Frederic
;
Champeaux, Corinne
;
Catherinot, Alain
;
Blondy, Pierre
.
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES,
2007, 55 (06)
:1314-1321

Lacroix, Benjamin
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Limoges, CNRS XLIM, UMR 6172, F-87060 Limoges, France Univ Limoges, CNRS XLIM, UMR 6172, F-87060 Limoges, France

Pothier, Arnaud
论文数: 0 引用数: 0
h-index: 0
机构: Univ Limoges, CNRS XLIM, UMR 6172, F-87060 Limoges, France

Crunteanu, Aurelian
论文数: 0 引用数: 0
h-index: 0
机构: Univ Limoges, CNRS XLIM, UMR 6172, F-87060 Limoges, France

Cibert, Christophe
论文数: 0 引用数: 0
h-index: 0
机构: Univ Limoges, CNRS XLIM, UMR 6172, F-87060 Limoges, France

Dumas-Bouchiat, Frederic
论文数: 0 引用数: 0
h-index: 0
机构: Univ Limoges, CNRS XLIM, UMR 6172, F-87060 Limoges, France

Champeaux, Corinne
论文数: 0 引用数: 0
h-index: 0
机构: Univ Limoges, CNRS XLIM, UMR 6172, F-87060 Limoges, France

Catherinot, Alain
论文数: 0 引用数: 0
h-index: 0
机构: Univ Limoges, CNRS XLIM, UMR 6172, F-87060 Limoges, France

Blondy, Pierre
论文数: 0 引用数: 0
h-index: 0
机构: Univ Limoges, CNRS XLIM, UMR 6172, F-87060 Limoges, France
[10]
Time-resolved visualization of the heat flow in VO2/Al2O3 films
[J].
Lee, J. S.
;
Ortolani, M.
;
Schade, U.
;
Chang, Y. J.
;
Noh, T. W.
.
APPLIED PHYSICS LETTERS,
2007, 90 (05)

Lee, J. S.
论文数: 0 引用数: 0
h-index: 0
机构: Berliner Elektronenspeicherring Gessellsch Synchr, D-12489 Berlin, Germany

Ortolani, M.
论文数: 0 引用数: 0
h-index: 0
机构: Berliner Elektronenspeicherring Gessellsch Synchr, D-12489 Berlin, Germany

Schade, U.
论文数: 0 引用数: 0
h-index: 0
机构: Berliner Elektronenspeicherring Gessellsch Synchr, D-12489 Berlin, Germany

Chang, Y. J.
论文数: 0 引用数: 0
h-index: 0
机构: Berliner Elektronenspeicherring Gessellsch Synchr, D-12489 Berlin, Germany

Noh, T. W.
论文数: 0 引用数: 0
h-index: 0
机构: Berliner Elektronenspeicherring Gessellsch Synchr, D-12489 Berlin, Germany