The MVTec 3D-AD Dataset for Unsupervised 3D Anomaly Detection and Localization

被引:52
作者
Bergmann, Paul [1 ,2 ]
Jin, Xin [3 ]
Sattlegger, David [1 ]
Steger, Carsten [1 ]
机构
[1] MVTec Software GmbH, Munich, Germany
[2] Tech Univ Munich, Munich, Germany
[3] Karlsruhe Inst Technol, Karlsruhe, Germany
来源
PROCEEDINGS OF THE 17TH INTERNATIONAL JOINT CONFERENCE ON COMPUTER VISION, IMAGING AND COMPUTER GRAPHICS THEORY AND APPLICATIONS (VISAPP), VOL 5 | 2022年
关键词
Anomaly Detection; Dataset; Unsupervised Learning; Visual Inspection; 3D Computer Vision;
D O I
10.5220/0010865000003124
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
We introduce the first comprehensive 3D dataset for the task of unsupervised anomaly detection and localization. It is inspired by real-world visual inspection scenarios in which a model has to detect various types of defects on manufactured products, even if it is trained only on anomaly-free data. There are defects that manifest themselves as anomalies in the geometric structure of an object. These cause significant deviations in a 3D representation of the data. We employed a high-resolution industrial 3D sensor to acquire depth scans of 10 different object categories. For all object categories, we present a training and validation set, each of which solely consists of scans of anomaly-free samples. The corresponding test sets contain samples showing various defects such as scratches, dents, holes, contaminations, or deformations. Precise ground-truth annotations are provided for every anomalous test sample. An initial benchmark of 3D anomaly detection methods on our dataset indicates a considerable room for improvement.
引用
收藏
页码:202 / 213
页数:12
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