A Novel, Organic, UV-Sensitive Resist Ideal for Nanoimprint-, Photo- and Laser Lithography in an Air Atmosphere

被引:5
作者
Greer, Andrew I. M. [1 ]
Gadegaard, Nikolaj [1 ]
机构
[1] Univ Glasgow, Sch Engn, Glasgow G12 8LT, Lanark, Scotland
基金
英国工程与自然科学研究理事会;
关键词
step-and-repeat; etch; resist; oxygen; photolithography; metallization; CONFORMAL IMPRINT LITHOGRAPHY; FABRICATION; TITANIUM; STAMPS; STEP; NIL;
D O I
10.1007/s13391-015-4401-x
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A UV-sensitive resist capable of curing in an oxygen atmosphere using single wavelength LED light sources is a niche area many UV-nanoimprint lithography resists are incapable of addressing. However, the novel negative tone resist, presently (2015) known as DELO-KATIOBOND OM VE 110707 (Delo-Katiobond), from Delo Industrial 10, Adhesives has been designed to be specifically compatible with such conditions within the 320 - 440 nm wavelength range. The authors acquired some of the resist and evaluated its photolithographic performance under such conditions. Several lithographic methods were evaluated, namely nanoimprint-, photo- and laser lithography. Under the step-and-flash nanoimprint test conditions the Delo-Katiobond outperformed commercial alternatives from AMO and Microresist Technology. Processing and development conditions for photo- and laser lithography are also presented. Different discrete wavelengths were used for curing the resist in these two separate lithography processes, 365 nm and 405 nm respectively. The laser-defined lines in Delo-Katiobond coatings were found to be a fraction of alternative resist Nano SU-8 from MicroChem. The functionality of the Delo-Katiobond resist is also evaluated here. It is demonstrated to be effective for a range of resist functions including metal lift-off, elastomeric polymer casting and as a mask for reactive ion etching of a variety of materials.
引用
收藏
页码:544 / 551
页数:8
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