Quantifying Image Charge Effects in Molecular Tunnel Junctions Based on Self-Assembled Monolayers of Substituted Oligophenylene Ethynylene Dithiols

被引:9
作者
Xie, Zuoti [2 ,5 ]
Cabanes, Valentin Diez [1 ]
Quyen Van Nguyen [2 ]
Rodriguez-Gonzalez, Sandra [1 ,3 ]
Norel, Lucie [4 ]
Galangau, Olivier [4 ]
Rigaut, Stephane [4 ]
Cornil, Jerome [1 ]
Frisbie, C. Daniel [2 ]
机构
[1] Univ Mons, Lab Chem Novel Mat, B-7000 Mons, Belgium
[2] Univ Minnesota, Dept Chem Engn & Mat Sci, Minneapolis, MN 55455 USA
[3] Univ Malaga, Dept Phys Chem, Malaga 29071, Spain
[4] Univ Rennes, CNRS, ISCR Inst Sci Chim Rennes, UMR 6226, F-3500 Rennes, France
[5] Guangdong Technion Israel Inst Technol, Dept Mat Sci & Engn, Shantou 515063, Guangdong, Peoples R China
基金
美国国家科学基金会;
关键词
molecular junction; tunneling; charge transport; image charge; Fermi level-HOMO offset; single level model; photoelectron spectroscopy; ENERGY-LEVEL ALIGNMENT; ELECTRON-TRANSPORT; WORK-FUNCTION; CONDUCTANCE; SURFACES; WIRES; GOLD; DEPENDENCE; LENGTH; AU;
D O I
10.1021/acsami.1c16398
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A number of factors contribute to orbital energy alignment with respect to the Fermi level in molecular tunnel junctions. Here, we report a combined experimental and theoretical effort to quantify the effect of metal image potentials on the highest occupied molecular orbital to Fermi level offset, epsilon(h), for molecular junctions based on self-assembled monolayers (SAMs) of oligophenylene ethynylene dithiols (OPX) on Au. Our experimental approach involves the use of both transport and photoelectron spectroscopy to extract the offsets, epsilon(trans)(h) and epsilon(UPS)(h), respectively. We take the difference in these quantities to be the image potential energy eV(image). In the theoretical approach, we use density functional theory (DFT) to calculate directly eV(image) between positive charge on an OPX molecule and the negative image charge in the Au. Both approaches yield eV(image) similar to -0.1 eV per metal contact, meaning that the total image potential energy is similar to -0.2 eV for an assembled junction with two Au contacts. Thus, we find that the total image potential energy is 25-30% of the total offset epsilon(h), which means that image charge effects are significant in OPX junctions. Our methods should be generally applicable to understanding image charge effects as a function of molecular size, for example, in a variety of SAM-based junctions.
引用
收藏
页码:56404 / 56412
页数:9
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