Polycrystalline-silicon-based double-gate ion-sensitive field-effect transistors using APTES/SiO2 stack-sensing membrane

被引:0
作者
Chen, Jun-Rong [1 ]
Chen, Henry J. H. [1 ]
Tseng, Shin-Lun [1 ]
机构
[1] Natl Chi Nan Univ, Dept Elect Engn, Puli 545, Nantou, Taiwan
关键词
poly-Si; ISFETs; double-gate; APTES; THRESHOLD VOLTAGE; PHYSICAL MODEL; DOUBLE-LAYER; SENSORS; ISFET; CAPACITANCE; HYSTERESIS;
D O I
10.35848/1347-4065/ac5422
中图分类号
O59 [应用物理学];
学科分类号
摘要
This study demonstrated a polycrystalline-silicon (poly-Si)-based double-gate (DG) ion-sensitive field-effect transistors (DG-ISFETs) using APTES/SiO2 stack-sensing membrane. The APTES/SiO2 stack-sensing membrane enhanced the single-gate (SG) sensitivity, and suppressed the hysteresis. The DG structure was preferred to have a capacitive coupling effect and to amplify the sensitivity of ISFETs. The sensitivities of SG- and DG-ISFETs were approximately 56.8 and 294 mV pH(-1), respectively. In addition, the corresponding amplifying factor was approximately 5.2. With this approach, the poly-Si DG-ISFETs can be a candidate for future high-performance biochemical sensing applications.
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页数:6
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