Effect of surface roughness on the anomalous Hall effect in Fe thin films

被引:12
|
作者
Zhang, Qiang [1 ,4 ]
Zheng, Dongxing [1 ]
Wen, Yan [1 ]
Zhao, Yuelei [1 ]
Mi, Wenbo [2 ]
Manchon, Aurelien [1 ]
Boulle, Olivier [3 ]
Zhang, Xixiang [1 ]
机构
[1] King Abdullah Univ Sci & Technol, Phys Sci & Engn Div PSE, Thuwal 239556900, Saudi Arabia
[2] Tianjin Univ, Sch Sci, Tianjin Key Lab Low Dimens Mat Phys & Preparat Te, Tianjin 300354, Peoples R China
[3] Univ Grenoble Alpes, Grenoble INP, CEA, IRIG SPINTEC,CNRS, F-38000 Grenoble, France
[4] New York Univ Abu Dhabi, Core Technol Platforms, POB 129188, Abu Dhabi, U Arab Emirates
关键词
Hall effect - Surface scattering - Ultrathin films;
D O I
10.1103/PhysRevB.101.134412
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Surface roughness plays an important role on the magnetotransport properties of thin films, especially in ultrathin films. In this work, we prepared Fe thin films with various surface roughness by using different seed layers and studied the electrical transport and anomalous Hall effect. By tuning surface roughness scattering, the longitudinal resistivity (rho(xx)) measured at 5 K increases by one order of magnitude and the corresponding anomalous Hall resistivity (rho(AHE)) increases by three times with increasing roughness. The intrinsic, skew-scattering, and side jump contributions to rho(AHE) were separated from our data. The anomalous Hall angle depends on the surface roughness, which may be of importance to the material engineering for achieving large spin Hall angle.
引用
收藏
页数:7
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