Calculation of Characteristic Impedance of Transmission Lines with Substrate Integrated Artificial Dielectric Structures

被引：0

作者：

Lim, Jongsik ^{[1
]}

Lee, Jun ^{[1
]}

Lee, Jaehoon ^{[1
]}

Jeong, Yongchae ^{[2
]}

Han, Sang-Min ^{[1
]}

Choi, Kwan-Sun ^{[1
]}

Ahn, Dal ^{[1
]}

机构：

[1] SoonChunHyang Univ, Asan, Chungnam, South Korea

[2] Chonbuk Natl Univ, Jeonju, South Korea

来源：

TENCON 2010: 2010 IEEE REGION 10 CONFERENCE | 2010年

基金：

新加坡国家研究基金会;

关键词：

DEFECTED GROUND STRUCTURE; CIRCUITS;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A calculation method for the characteristic impedance of transmission lines with any perturbation structure is proposed. An analytical procedure is described with proper equations based on simple transmission line theories. The obtained characteristic impedance by the proposed method shows an almost constant value, while it fluctuates severely depending on the frequency in the conventional method. As a sample transmission line element, a microstrip line with the substrate integrated artificial dielectric (SIAD) structure is selected for calculating the characteristic impedance by the proposed method. The calculated characteristic impedances from the simulated and measured S-parameters well converge to a constant value without fluctuation.

引用

页码：1632 / 1635

页数：4

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