Hardware Realization of the System for Automated Current-Voltage Characteristics Measurement for Semiconductor Devices

被引：0

作者：

Zaitsev, R. V. ^{[1
]}

Kirichenko, M. V. ^{[1
]}

Momotenko, O. V. ^{[1
]}

Polezhaeva, O. V. ^{[1
]}

Prokopenko, D. S. ^{[1
]}

机构：

[1] NTU KhPI, Mat Elect & Solar Cells Dept, Kharkov, Ukraine

来源：

2015 INTERNATIONAL YOUNG SCIENTISTS FORUM ON APPLIED PHYSICS (YSF) | 2015年

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中图分类号：

O59 [应用物理学];

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摘要：

引用

页数：3

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