Defect related issues in the "current roll-off" in InGaN based light emitting diodes

被引：242

作者：

Monemar, B. ^{[1
]}

Sernelius, B. E. ^{[1
]}

机构：

[1] Linkoping Univ, Dept Phys Chem & Biol, S-58183 Linkoping, Sweden

来源：

APPLIED PHYSICS LETTERS | 2007年 / 91卷 / 18期

关键词：

D O I：

10.1063/1.2801704

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Defect related contributions to the reduction of the internal quantum efficiency of InGaN-based multiple quantum well light emitting diodes under high forward bias conditions are discussed. Screening of localization potentials for electrons is an important process to reduce the localization at high injection. The possible role of threading dislocations in inducing a parasitic tunneling current in the device is discussed. Phonon-assisted transport of holes via tunneling at defect sites along dislocations is suggested to be involved, leading to a nonradiative parasitic process enhanced by a local temperature rise at high injection. (C) 2007 American Institute of Physics.

引用

页数：3

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