RL-Huffman encoding for test compression and power reduction in scan applications

被引：102
作者：
Nourani, M [1 ]
Tehranipour, MH [1 ]
机构：
[1] Univ Texas, Erik Jonsson Sch Engn & Comp Sci, Ctr Integrated Circuits & Syst, Richardson, TX 75083 USA
来源：
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS | 2005年 / 10卷 / 01期
关键词：
design; algorithms; compression ratio; decompression; Huffman encoding; runlength encoding; scan-in test power; switching activities; test pattern compression; test compression; power reduction; scan applications;
D O I：
10.1145/1044111.1044117
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This article mixes two encoding techniques to reduce test data volume, test pattern delivery time, and power dissipation in scan test applications. This is achieved by using run-length encoding followed by Huffman encoding. This combination is especially effective when the percentage of don't cares in a test set is high, which is a common case in today's large systems-on-chips (SoCs). Our analysis and experimental results confirm that achieving up to an 89% compression ratio and a 93% scan-in power reduction is possible for scan-testable circuits such as ISCAS89 benchmarks.
引用
收藏
页码：91 / 115
页数：25
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